FEI MICRION 875 AUTOFIB Products

  • FEI: SNP XT Rapid CD

    Details
    ID#:
    9058073
    Category:
    Wafer Testing And M...
    Photomask metrology system | P/N: SNP100 | Delivers 3-D critical dimension capability for the 65nm node | Next Generation Precision Scanning System | Upgraded high magnification microscope | SNP XT field upgradable with Rapid CD capability | | ScanHead | Z stage Gear box | Cognex board | XT Z stage linear encoder | Laser head, 5517C | Monitor, 5,6“ | Motion controller | Robot System | | CD repeatability: 3.4nm | CD reproducibility: 4.5nm | Calibration CD standards: no | Sidewall angle precision: <3° | Automated defect review: no | Depth repeatability: 0.6nm | Depth reproducibility: 0.2nm | Calibrated depth standards: yes | Tip size: 120nm x 240nm | | Operating hours: ~18,000.
  • PHILIPS / FEI: XL 40

    Details
    ID#:
    9049866
    Category:
    Scanning Electron M...
    SEM | LaB6 emitter, 6-position bias control | OS: Windows 3.11 | Fully integrated image storage | ET type Secondary Electron Detector | FEI (Philips) Solid State BSE detector | CCD Chamberscope | Resolution: 3nm at 30kV; 15nm at 1kV | Magnification range: 10x – 400,000x | Accelerating Voltage: 0.2 to 30kV | Drawer type door | 5 axis stage (XYZRT) – XYR motorized with 150mm travel in X and Y | Manual Tilt and Z adjustment | External Z adjustment of 37mm | Interior chamber size 379mm x 325mm x 315mm | (8) accessory ports, including BNC electrical feedthrough | Currently installed.
  • FEI: Nova Nanolab 200

    Details
    ID#:
    151369
    Category:
    Ion Milling
    Vintage:
    2005 
    Ion beam system, 2005 vintage.
  • FEI: Tecnai G2 20

    Details
    ID#:
    9030551
    Category:
    Scanning Electron M...
    TEM | 200 kV LaB6 | BF, DF modes | FEI TIA UI | Compustage | Single tilt holder | | Optional: Camera and EDS.
  • FEI: Morgagni

    Details
    ID#:
    9047343
    Category:
    Scanning Electron M...
    Vintage:
    2008 
    Scanning electron microscope (SEM) | Tungsten filament | 1 K x 1 K side mount camera | Single tilt holder | 100 kV | 2008 vintage.
  • FEI: Tecnai 10

    Details
    ID#:
    151424
    Category:
    Scanning Electron M...
    TEM, 100kV | Biological Set up | Optional AMT Sidemount CCD.
  • FEI: Tecnai F30

    Details
    ID#:
    9030550
    Category:
    Scanning Electron M...
    S/TEM | 300 kV Schottky FEG | BF, DF, HAADF | EFTEM EELS | EDS | 2k x 2k CCD | Gatan 863 Tridiem | BiPrism | Lorentz lens | Tecnai free lens control | Single tilt, high visibility double tilt, and holography holders.
  • FEI: 825i

    Details
    ID#:
    194572
    Category:
    Ion Milling
    Ion beam inspection tool, 8" | EDX is not working | Currently de-installed | Cables intact | 1998 vintage.
  • FEI: DualBeam 820

    Details
    ID#:
    9026430
    Category:
    Ion Milling
    Dual ion beam FIB / SEM.
  • PHILIPS / FEI: FIB-610

    Details
    ID#:
    9021863
    Category:
    Scanning Electron M...
    Focused ion beam imaging workstation | | Includes: | FEI LBO-51MA display | FEI PCSP system power controller | FEI ID2 deflection controller | FEI SCI stage controller | FEI 1IPS ion pump power supply | FEI 1GI gas injection controller | FEI CPS video controller | FEI MVD deposition control unit | TurboTronik NT-340-M turbo pump controller | | SCI stage control module is misaligned with the fastening holes | PCSP system power controller has missing joystick.
  • FEI: XL 30 FEG

    Details
    ID#:
    9028893
    Category:
    Scanning Electron M...
    TEM, 1996 vintage.
  • FEI: 820

    Details
    ID#:
    9052452
    Category:
    Ion Milling
    Focused ion beam dual beam system | 220 V, 50/60 Hz, 3,500 VA | 1996 vintage.
  • FEI: Nova NanoSEM 430

    Details
    ID#:
    9047188
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    SEM | High and low vacuum | High resolution | FEG SEM | 4" mm x 4" mm stage | Loaded: TLD SE, BSE, SED, LV SED (LVD), UHR LV SED (Helix), Low KV BSED, GAD | 2011 vintage.
  • FEI: DualBeam 835

    Details
    ID#:
    9047185
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam FIB / SEM, 8" | Magnum ion | 2 GIS | 8" Load lock | 2000 vintage.
  • FEI: 23229

    Details
    ID#:
    9024592
    Category:
    Spare Parts
    Aperture strip, prelens.
  • FEI: 200 XP

    Details
    ID#:
    168986
    Category:
    Ion Milling
    FIB system | Prelens ion column | Can be customized to your needs.
  • FEI: Morgagni

    Details
    ID#:
    9051785
    Category:
    Scanning Electron M...
    TEM | Currently installed.
  • FEI: 820

    Details
    ID#:
    67528
    Category:
    Ion Milling
    Focused Ion Beam dual beam system, complete with extra accessories.
  • FEI: Tecnai G2 F20

    Details
    ID#:
    141774
    Category:
    Scanning Electron M...
    TEM | S-Twin lens | EDAX EDS included | 2004 vintage.
  • FEI: Nova 200

    Details
    ID#:
    9046379
    Category:
    Scanning Electron M...
    Dual beam system, parts machine.
Copyright © 2011 Capital Asset Exchange & Trading LLC. All rights reserved.