FEI QUANTA 450 Products

  • FEI: Nova NanoSEM 450

    Details
    ID#:
    9070198
    Category:
    Scanning Electron M...
    FE-SEM | Manual user interface | Support computer | Helix detector | Retractable STEM detector (STEMIII) | DBS detector retractable | GAD low-kV SSBSED | 6-Channel detector amplifier | Quick loader | STEM III quickloader adaption; pre-tilted holder | Plasma cleaner | CryCleaner EC | Nav-Cam | SIS Scandium imagine software | (4) SIS Scandium desktop license | SIS Scandium solution height | Network dongle licences 50 | Correlative navigation | 4" Wafer holder | 6" Wafer holder BON | UMB Specimen holder kit | Acoustic enclosure for prevacuum pump | 50-pin electrical feedthrough | 7-pin Coax electrical feedthrough | TEAM integration kit | (4) Thermoflex Chiller, 50Hz.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9072023
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    3D FIB-SEM | Electron column: Magnum with 20nA | ESEM mode | FIB column | 2004 vintage.
  • PHILIPS / FEI: Quanta 200 MK2

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker AXS Quantax 400 SDD X-ray detector (2007 vintage) | Low Vacuum Mode | Environmental Mode | Integrated CCD chamberscope | PC-based Windows XP GUI for FE-SEM and EDS | Turbo pumped specimen chamber | Emitter: installed | 2006 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • FEI: FIB 200

    Details
    ID#:
    9082663
    Category:
    Ion Milling
    Focused Ion Beam System | | Single beam | Pre-lens ion column: | Provides image resolution of 7nm and milling current up to 11nA | Enables deflection (for scanning) before the final lens, bringing the lens closer to the sample for best spot size | 50x50mm XY stage, with rotation, tilt and z-motions | Loadlock with separate pump for fast sample exchange | Turbo pump for main chamber | Real time monitor to observe milling, aka Leader oscilloscope | Keithley Pico-ammeter to measure beam current | (2) GIS types to be selected from: EE, IEE, Metal dep (Pt) or TEOS | Chamber camera and monitor | Operating system: Windows NT | Computer control with FEI software and Seiko screen printer | Manual user interface (MUI), joystick and mouse controls | Manuals | (2) gas injectors with controller: choose from iodine, XeF2, Platinum, or TEOS gases | Line transformer (main), AC distribution box and Maintenance tool kit.
  • FEI: DualBeam 865

    Details
    ID#:
    9076200
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2002 
    Dual ion beam FIB / SEM | Schottky FEG SEM | Magnum ion column | Low KV capable for Hi-Res TEM sample preparation | SE and BSE imaging | Secondary ion imaging | Resolution of SEM: 3 nm at 5 KV and 30 KV | Software: Window XP, FEI XP UI | Stage: 200 mm full travel, -5° to 60° tilt | (3) GISes | Wafer robot | | De-installed in Q4 2012 | 2002 vintage.
  • FEI: DualBeam 835

    Details
    ID#:
    9047185
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam FIB / SEM, 8" | Magnum ion | 2 GIS | 8" Load lock | 2000 vintage.
  • FEI: DualBeam 830

    Details
    ID#:
    9047184
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    1999 
    Dual ion beam FIB / SEM, 8" | Pre lens ion | 2 GIS | Turbo vacuum | 1999 vintage.
  • FEI: 820

    Details
    ID#:
    67528
    Category:
    Ion Milling
    Focused Ion Beam dual beam system, complete with extra accessories.
  • FEI: 5322-695-16115

    Details
    ID#:
    9024620
    Category:
    Spare Parts
    Poletip 60° Snorlens.
  • FEI: 4035-272-16981

    Details
    ID#:
    9024619
    Category:
    Spare Parts
    F/G, S-ion column.
  • FEI: Nova NanoSEM 430

    Details
    ID#:
    9047188
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    SEM | High and low vacuum | High resolution | FEG SEM | 4" mm x 4" mm stage | Loaded: TLD SE, BSE, SED, LV SED (LVD), UHR LV SED (Helix), Low KV BSED, GAD | 2011 vintage.
  • VARIAN: 450-GC

    Details
    ID#:
    9047982
    Category:
    Lab Equipment And A...
    Vintage:
    2003 
    Gas chromatograph | Includes: | 220-MS Mass spectrometer | Varian DS 42 RVP Vacuum Pump | Optiplex 960 CPU | Monitor, Mouse, Keyboard | Varian MS Workstation | Varian Scanview 8.4 Chromatography and Spectroscopy Applications Database | Varian 430-GC and 450-GC User Manuals CD | Varian MS Test Files CD | Varian NIST08 Mass Spectral Library CD | | Voltage: 120 V | Frequency : 50/60 Hz | 2003 vintage.
  • FEI: DualBeam 820

    Details
    ID#:
    9026430
    Category:
    Ion Milling
    Dual ion beam FIB / SEM.
  • FEI: 4022-262-21611

    Details
    ID#:
    9024618
    Category:
    Spare Parts
    Deflector test box.
  • FEI: Accura 800

    Details
    ID#:
    9085589
    Category:
    Mask & Wafer Inspec...
    Vintage:
    2004 
    Mask inspection and repair system, 2004 vintage.
  • FEI: 24115

    Details
    ID#:
    9024609
    Category:
    Spare Parts
    Quick change beam acceptance aperture replacement kits, 20nA.
  • FEI: 4022-197-94963

    Details
    ID#:
    9024608
    Category:
    Spare Parts
    PM supply 10kV EXS.
Copyright © 2011 Capital Asset Exchange & Trading LLC. All rights reserved.