FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9072023
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    3D FIB-SEM | Electron column: Magnum with 20nA | ESEM mode | FIB column | 2004 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9095679
    Category:
    Scanning Electron M...
    3D Scanning electron microscopes (SEM). |
  • PHILIPS / FEI: Quanta 400

    Details
    ID#:
    9100096
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX | Software included.
  • PHILIPS / FEI: Quanta 200 MK2

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2007 
    Field emission scanning electron microscope (FE-SEM) | 133 eV at MN resolution | | Electron source Schottky thermal assisted Field Emission | (3) Modes: High vacuum, Low Vacuum, Environmental (ESEM) | 4-Axis motorized specimen stage: XY 50 mm traverse | OEM Hot/Cold stage accessory: hot stage specimen | Holder | Water chiller / Recirculator | Faraday beam current measurement accessory | Integrated CCD chamber-scope | Turbo pumped specimen chamber | PC-based analyzer Windows XP Pro OS: Espirit Vs 1.8.2.2072 | | Bruker AXS Quantax 400 SDD X-ray detector (2007 vintage) | Analysis AXS XFlash Detector 4010 | Detector mounted at 35°, Analytical W.D. is 10mm | Liquid Nitrogen-Free detector | Peltier cooled | | Accelerating voltage: 200-300 V | Probe current: up to 100 nA, continuous variable | 2007 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • FEI: Expida 1285

    Details
    ID#:
    9095881
    Category:
    Ion Milling
    Wafer Size:
    8"-12" 
    Scanning Microscope System, 8"-12" | Integrated electron and ion columns for semi-automated process control | Defect review, characterization, and failure analysis | | (1) Notched wafer holder | In-lens detection system for secondary and backscattered electrons | FEI xP software: wafer alignment, repetitive FIB operations, and critical dimension | (6) axial accessory ports for gas chemistry (4 maximum) | EDS detectors | Optical microscopes | Automatic vacuum system with integrated wafer loadlock | Oil-free turbomolecular pumping system for specimen chamber | (3) Ion pumps for differential pumping of ion and electron columns | Rough pump foreline | Robotic 8"/12" autoloader with non-contact prealigner | | High resolution Sirion FE-SEM column: 0.2 to 30 KeV | Schottky thermal field emitter | 60° Dual-objective lens: field free and immersion modes | Motorized heated objective apertures | | High intensity FEI Sidewinder ion column | Beam current range from 1 pA to 20 nA. | | (5) Axis motorized 305 mm stage | High accuracy optical encoders | Closed loop computer control | Multi-axis joystick | | Distributed control | Pentium-based host computer | Controls multiple single-board satellite processors | MS Windows operating system | Integrated 19" LCD color monitor | Video printer | | Manual user interface (MUIF) console | Stigmation | Magnification | XY fine position | Standard mouse control | | Integral vibration and stray field cancellation system | SEMI S2-0703 and CE compliant. | | Options available: | Roughing pump | FOUP, SMIF, or open cassette load.
  • FEI: DualBeam 865

    Details
    ID#:
    9076200
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2002 
    Dual ion beam FIB / SEM | Schottky FEG SEM | Magnum ion column | Low KV capable for Hi-Res TEM sample preparation | SE and BSE imaging | Secondary ion imaging | Resolution of SEM: 3 nm at 5 KV and 30 KV | Software: Window XP, FEI XP UI | Stage: 200 mm full travel, -5° to 60° tilt | (3) GISes | Wafer robot | | De-installed in Q4 2012 | 2002 vintage.
  • FEI: Strata 400

    Details
    ID#:
    9107025
    Category:
    Ion Milling
    Vintage:
    2006 
    Focused ion beam system | Software: xT version 2.0.5 FEI desk PCs | Main use: TEM lamellae preparation | Dual beam, STEM capable FIB SEMl | 76x76 stage 5 axis motor with flip-stage | Ga LMIS source | Omniprobe Autoprobe 200.1 | Gaseous sources ePt, | Ion Pt | Separate card interface and mains power supply cabinet | Documentation | User Manual 10/12/2004 2nd edition, installation disks (CD) | User Log books 2006 - 2015 | PM reports: yes: under Maintenance contract with FEI | 6 channel detector card | Autoprobe z-sensor and actuator | Stage TMCB card | FEI desk PC and harddisk | Missing chiller | 2006 vintage.
  • FEI: Tecnai 10

    Details
    ID#:
    151424
    Category:
    Scanning Electron M...
    TEM, 100kV | Biological Set up | Optional AMT Sidemount CCD.
  • FEI: 825i

    Details
    ID#:
    194572
    Category:
    Ion Milling
    Ion beam inspection tool, 8" | EDX is not working | Currently de-installed | Cables intact | 1998 vintage.
  • FEI: DualBeam 835

    Details
    ID#:
    9047185
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam FIB / SEM, 8" | Magnum ion | 2 GIS | 8" Load lock | 2000 vintage.
  • FEI: Nova NanoSEM 430

    Details
    ID#:
    9047188
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    SEM | High and low vacuum | High resolution | FEG SEM | 4" mm x 4" mm stage | Loaded: TLD SE, BSE, SED, LV SED (LVD), UHR LV SED (Helix), Low KV BSED, GAD | 2011 vintage.
  • FEI: DB235

    Details
    ID#:
    9085333
    Category:
    Ion Milling
    DualBeam FIB System.
  • VARIAN: 450-GC

    Details
    ID#:
    9047982
    Category:
    Lab Equipment And A...
    Vintage:
    2003 
    Gas chromatograph | Includes: | 220-MS Mass spectrometer | Varian DS 42 RVP Vacuum Pump | Optiplex 960 CPU | Monitor, Mouse, Keyboard | Varian MS Workstation | Varian Scanview 8.4 Chromatography and Spectroscopy Applications Database | Varian 430-GC and 450-GC User Manuals CD | Varian MS Test Files CD | Varian NIST08 Mass Spectral Library CD | | Voltage: 120 V | Frequency : 50/60 Hz | 2003 vintage.
  • FUJI IMPULSE: FA-450-5W

    Details
    ID#:
    9050694
    Category:
    Packaging
    Electric sealer | Seal width: 5 mm | Seal length: 450 mm.
  • PHILIPS / FEI: XL 40

    Details
    ID#:
    9049866
    Category:
    Scanning Electron M...
    SEM | LaB6 emitter, 6-position bias control | EDX | OS: Windows 3.11 | Fully integrated image storage | ET type Secondary Electron Detector | FEI (Philips) Solid State BSE detector | CCD Chamberscope | Resolution: 3nm at 30kV; 15nm at 1kV | Magnification range: 10x – 400,000x | Accelerating Voltage: 0.2 to 30kV | Drawer type door | 5 axis stage (XYZRT) – XYR motorized with 150mm travel in X and Y | Manual Tilt and Z adjustment | External Z adjustment of 37mm | Interior chamber size 379mm x 325mm x 315mm | (8) accessory ports, including BNC electrical feedthrough | Currently installed.
  • FEI: 820

    Details
    ID#:
    9084978
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    1998 
    Focused Ion system, 8" | Dual beam | Model: XCDA-Z | ION source: needs to be refilled | Currently installed.
  • FEI: DualBeam 830

    Details
    ID#:
    9047184
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    1999 
    Dual ion beam FIB / SEM, 8" | Pre lens ion | 2 GIS | Turbo vacuum | 1999 vintage.
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