FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • FEI: Nova NanoSEM 450

    Details
    ID#:
    9070198
    Category:
    Scanning Electron M...
    FE-SEM | Manual user interface | Support computer | Helix detector | Retractable STEM detector (STEMIII) | DBS detector retractable | GAD low-kV SSBSED | 6-Channel detector amplifier | Quick loader | STEM III quickloader adaption; pre-tilted holder | Plasma cleaner | CryCleaner EC | Nav-Cam | SIS Scandium imagine software | (4) SIS Scandium desktop license | SIS Scandium solution height | Network dongle licences 50 | Correlative navigation | 4" Wafer holder | 6" Wafer holder BON | UMB Specimen holder kit | Acoustic enclosure for prevacuum pump | 50-pin electrical feedthrough | 7-pin Coax electrical feedthrough | TEAM integration kit | (4) Thermoflex Chiller, 50Hz.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker EDS | SDD X-ray system (2007 vintage) | 2006 vintage.
  • PHILIPS / FEI: Quanta

    Details
    ID#:
    9045193
    Category:
    Scanning Electron M...
    3D FIB | Tungsten electron column.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9072023
    Category:
    Scanning Electron M...
    3D FIB-SEM | Includes: | Electron column | ESEM mode.
  • FEI: DualBeam 865

    Details
    ID#:
    9076200
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2002 
    Dual ion beam FIB / SEM | Schottky FEG SEM | Magnum ion column | Low KV capable for Hi-Res TEM sample preparation | SE and BSE imaging | Secondary ion imaging | Resolution of SEM: 3 nm at 5 KV and 30 KV | Software: Window XP, FEI XP UI | Stage: 200 mm full travel, -5° to 60° tilt | (3) GISes | Wafer robot | | De-installed in Q4 2012 | 2002 vintage.
  • FEI: Tecnai G2 F20

    Details
    ID#:
    141774
    Category:
    Scanning Electron M...
    TEM | S-Twin lens | EDAX EDS included | 2004 vintage.
  • LEYBOLD HERAEUS: TMP 450

    Details
    ID#:
    180233
    Category:
    Pumps
    Turbo pumps with Turbotronik NT 450 controllers.
  • FEI: DualBeam 835

    Details
    ID#:
    9047178
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam SEM / FIB, 8" | Magnum ion | 2 GIS | Wafer loading robot | 2000 vintage.
  • FEI: 835

    Details
    ID#:
    9058950
    Category:
    Ion Milling
    Ion beam FIB / SEM.
  • FEI: DualBeam 830

    Details
    ID#:
    9047184
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    1999 
    Dual ion beam FIB / SEM, 8" | Pre lens ion | 2 GIS | Turbo vacuum | 1999 vintage.
  • FEI: DualBeam Expida 1285

    Details
    ID#:
    9047183
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam FIB / SEM, 8" - 12" | 2000 vintage.
  • FEI: 800

    Details
    ID#:
    9046863
    Category:
    Ion Milling
    Focused ion beam system | 8" XY Stage travel | Prelens | (2) GIS | 1999 vintage.
  • FEI: 200xP

    Details
    ID#:
    9046854
    Category:
    Ion Milling
    Focused ion beam system | Magnum ion column | 50 mm Stage | (2) GIC | Turbo vacuum | 1999 vintage.
  • PHILIPS / FEI: XL 40

    Details
    ID#:
    9065023
    Category:
    Scanning Electron M...
    FEG SystemWindows NT | EDAX (DX-4) system | Magnification range: 10x to 400,000x | ET type Secondary Electron Detector | FEI (Philips) Solid State BSD detector | MCtrl version 6.0 | Fully integrated image storage | CCD Chamber scope | 35 degree X-Ray takeoff angle | 3nm at 30kV; 15nm at 1kV | Accelerating Voltage: 0.2 to 30kV | | Stage & Specimen Handling: | Drawer type door | 5 axis stage (XYZRT) ­ XYR motorized | 150mm motorized travel in X and Y | Manual Tilt and Z | External Z adjust of 37mm | Maximum free space of 55mm for thick specimens | Interior chamber size 379mm x 325mmx 315mm | | Neslab chiller and pump included | 1996 vintage.
  • FEI: 825i

    Details
    ID#:
    194572
    Category:
    Ion Milling
    Ion beam inspection tool, 8" | EDX is not working | Currently de-installed | Cables intact | 1998 vintage.
  • FEI: Tecnai F30

    Details
    ID#:
    9063939
    Category:
    Scanning Electron M...
    FE-TEM | | Includes: | TEM Body: Main unit | FEG Gun: Electron gun | H/T Tank | Chiller with PCW supply | Power cabinet: Main unit with power supply | STEM Cabinet: STEM Cabinet, (2) PC and HDD Remote | TEM Cabinet | Water rack | Cover | Desk | ETC: Monitor, turbo controller | | Non-SMIF | Automatic online component: No | Wafer OF Type: Notch at 6 o'clock | Software OS: Windows | No PPD | Option for lens cloudiness: PL Purge | 2007 vintage.
  • FEI: 820

    Details
    ID#:
    67528
    Category:
    Ion Milling
    Focused Ion Beam dual beam system, complete with extra accessories.
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