FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker EDS | SDD X-ray system (2007 vintage) | 2006 vintage.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • PHILIPS / FEI: Quanta

    Details
    ID#:
    9045193
    Category:
    Scanning Electron M...
    3D FIB | Tungsten electron column.
  • FEI: Nova NanoSEM 450

    Details
    ID#:
    9070198
    Category:
    Scanning Electron M...
    FE-SEM | Manual user interface | Support computer | Helix detector | Retractable STEM detector (STEMIII) | DBS detector retractable | GAD low-kV SSBSED | 6-Channel detector amplifier | Quick loader | STEM III quickloader adaption; pre-tilted holder | Plasma cleaner | CryCleaner EC | Nav-Cam | SIS Scandium imagine software | (4) SIS Scandium desktop license | SIS Scandium solution height | Network dongle licences 50 | Correlative navigation | 4" Wafer holder | 6" Wafer holder BON | UMB Specimen holder kit | Acoustic enclosure for prevacuum pump | 50-pin electrical feedthrough | 7-pin Coax electrical feedthrough | TEAM integration kit | (4) Thermoflex Chiller, 50Hz.
  • FEI: 19011

    Details
    ID#:
    9024611
    Category:
    Spare Parts
    Standard sample test systems.
  • FEI: DualBeam 830

    Details
    ID#:
    9047184
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    1999 
    Dual ion beam FIB / SEM, 8" | Pre lens ion | 2 GIS | Turbo vacuum | 1999 vintage.
  • FUJI IMPULSE: FA-450-5W

    Details
    ID#:
    9050694
    Category:
    Packaging
    Electric sealer | Seal width: 5 mm | Seal length: 450 mm.
  • TRANE: CVHE 450

    Details
    ID#:
    9007107
    Category:
    Chillers - Industri...
    Vintage:
    2005 
    Chiller, 450 ton | | Includes: | Centrifugal compressor | Ecological refrigerant R123 | Water cooled | Hours: 500 | | 460 V, 3-Ph, 60 Hz | 2005 vintage.
  • FEI: Nova NanoSEM 430

    Details
    ID#:
    9047188
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    SEM | High and low vacuum | High resolution | FEG SEM | 4" mm x 4" mm stage | Loaded: TLD SE, BSE, SED, LV SED (LVD), UHR LV SED (Helix), Low KV BSED, GAD | 2011 vintage.
  • FEI: DualBeam 835

    Details
    ID#:
    9047185
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam FIB / SEM, 8" | Magnum ion | 2 GIS | 8" Load lock | 2000 vintage.
  • FEI: DualBeam Expida 1285

    Details
    ID#:
    9047183
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam FIB / SEM, 8" - 12" | 2000 vintage.
  • FEI: DualBeam 835

    Details
    ID#:
    9047178
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam SEM / FIB, 8" | Magnum ion | 2 GIS | Wafer loading robot | 2000 vintage.
  • FEI: DA300

    Details
    ID#:
    9052303
    Category:
    Wafer Testing And M...
    Wafer Size:
    12" 
    Defect analyzer, 12" | | Includes: | Dual beam system | Electron imaging | Focused ion beam milling | FOUP wafer handling | Omniprobe nanomanipulator | Scanning transmission electron microscopy (STEM) | Energy dispersive x-ray spectroscopy (EDX) | Gas injection systems (GIS) with tool automation: | Deposition: Platinum, Tungsten | Reactive: Insulator enhanced etching (XEF2) | TEM Sample preparation | Cross section and plan view lamellae | Low kV cleaning capability | SEM Imaging | Electron or ion beam milling/deposition | | Sample stage: 12" | Stage motion: 305 x 305 mm travel | Stage motion: 1.5 μm accuracy | Schottyky electron gun: 200 V - 30 kV | Image resolution: 7 nm FIB, 2 nm SEM | Liquid metal gallium ion source: 5 - 30 kV | Milling current range: pA - nA | STEM imaging: DF, BF, HAADF 1.1 nm at 30 kV.
  • FEI: 820

    Details
    ID#:
    9052452
    Category:
    Ion Milling
    Focused ion beam dual beam system | 220 V, 50/60 Hz, 3,500 VA | 1996 vintage.
  • FEI: Tecnai 10

    Details
    ID#:
    151424
    Category:
    Scanning Electron M...
    TEM, 100kV | Biological Set up | Optional AMT Sidemount CCD.
  • FEI: Tecnai F30 S-Twin

    Details
    ID#:
    9062878
    Category:
    Scanning Electron M...
    FE-TEM | 300KV | | Operational system: | Electron microscope TECNAI F30 S-TWIN, FP 5035/20 | NEC 20" Monitor, 9432-909-93371 | Extended Work Station, 5352/02 | Imaging and analysis software, 5400/00 | CompuStage Low Background Dbl-tilt holder, 6595/15 | Low dose exposure technique, 5407/00 | 28 sheet film holder, 6209/20 | Magazine for 56 unexposed sheet film holders, 6222/00 | Magazine for 56 exposed sheet film holders, 6223/00 | Desiccator for 2 magazines, 92021 | Replacement FEG assembly, 6180/00 | Mains matching Transformer, 6345/51 | Cooling water unit 60hz, 9432 909 96311 | Spare Objective Aperture, 6149/50 | FEG Diagnostics, 5265/00 | TEM General Diagnostics, 5266/00 | STEM General Diagnostics, 5267/00 | HT Diagnostics, 5269/20 | Air compressor, 9432-909-96271 | Electron optics: | Tecnai Scripting, 5451/00 | Tecnai Photo montage, 5456/00 | Gatan 894.P27FAP | | STEM and HAADF: | EDX Spectroscopy Technique, 5402/00 | Digital Pulse Processor, 9432-909-95322 | Detector Unit , PV 9761/08 | Beam Control and Mapping software Pkg, 9432-909-95391 | EDAX Mat.Sc. TEM SW, 95371 | External Analog Interface XAIB, 6778/00 | | GATAN Cameras: | Gatan Ultrascan 1000 2kx2k / Grade 2(B) | Gatan retractable TV rate CCD Camera type 692, 9432-909-22434 | Digital Micrograph for Tecnai, 5406/40 | Slow Scan CCD imaging technique, 5406/00 | TV rate imaging Technique, 5405/00 | | Holography Option 2D Dopant Profiling: | Lorenz Lens, 9432-900-22431 | Biprism Holder, 9432-900-22432 | Holoworks SW (Gatan), 9432-900-22433.
  • FEI: SDP-100 SIMS III

    Details
    ID#:
    9062899
    Category:
    Spare Parts
    SIMS detector | For FIB-200 dual beam FIB/SEM.
  • PHILIPS / FEI: XL 40

    Details
    ID#:
    9065023
    Category:
    Scanning Electron M...
    FEG SystemWindows NT | EDAX (DX-4) system | Magnification range: 10x to 400,000x | ET type Secondary Electron Detector | FEI (Philips) Solid State BSD detector | MCtrl version 6.0 | Fully integrated image storage | CCD Chamber scope | 35 degree X-Ray takeoff angle | 3nm at 30kV; 15nm at 1kV | Accelerating Voltage: 0.2 to 30kV | | Stage & Specimen Handling: | Drawer type door | 5 axis stage (XYZRT) ­ XYR motorized | 150mm motorized travel in X and Y | Manual Tilt and Z | External Z adjust of 37mm | Maximum free space of 55mm for thick specimens | Interior chamber size 379mm x 325mmx 315mm | | Neslab chiller and pump included | 1996 vintage.
Copyright © 2011 Capital Asset Exchange & Trading LLC. All rights reserved.