FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • FEI: Quanta 200

    Details
    ID#:
    9052447
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    3D Dual beam Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) | | Hardware: | Standard Detectors: (ETD, CCD camera) | Additional Environmental Detectors: GSED, X-ray PLA | 2-channel Detector Pre-amplifier | Stage: 50mm 5-axis motorized | External Scan Interface | (1) Platinum Gas Insertion System (GIS) | Turbo Molecular Pump with Roughing Pumps (2x Edwards XDS10) | Compressor (120V, 60Hz with 4-liter tank) | Power: 230VAC 50/60Hz, 20A max current requirement | | Hardware Upgrade: | Nanopattern Generation System (NPGS) | | Performance (at install): | Electron Column: 2.86nm resolution at 30kV | Ion Column: 8.245nm resolution at 30kV | | Consumables: | Spare tungsten filaments | Spare apertures | | PC (FIB): | HP xw4400 workstation, Intel Core2 6300, 1.86Ghz | Windows XP, xTm software version 1.7.4 | | PC (NPGS): | HP xw4600 workstation, Intel Core2Duo E8200 2.66 Ghz | Windows XP, NPGS Version 9.0.265 (2012) | | Additional Software: | AutoFIB | AutoTEM | AutoSlice and View | Amira | | 2006 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker EDS | SDD X-ray system (2007 vintage) | 2006 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • PHILIPS / FEI: Quanta

    Details
    ID#:
    9045193
    Category:
    Scanning Electron M...
    3D FIB | Tungsten electron column.
  • FEI: Tecnai G2 20

    Details
    ID#:
    9030551
    Category:
    Scanning Electron M...
    TEM | 200 kV LaB6 | BF, DF modes | FEI TIA UI | Compustage | Single tilt holder | | Optional: Camera and EDS.
  • FEI: 4022-197-94963

    Details
    ID#:
    9024608
    Category:
    Spare Parts
    PM supply 10kV EXS.
  • FEI: 820

    Details
    ID#:
    67528
    Category:
    Ion Milling
    Focused Ion Beam dual beam system, complete with extra accessories.
  • FEI: 4035-272-05751

    Details
    ID#:
    9024607
    Category:
    Spare Parts
    CDEM.
  • FEI: 820

    Details
    ID#:
    9052452
    Category:
    Ion Milling
    Focused ion beam dual beam system | 220 V, 50/60 Hz, 3,500 VA | 1996 vintage.
  • FEI: DA300

    Details
    ID#:
    9052303
    Category:
    Wafer Testing And M...
    Wafer Size:
    12" 
    Defect analyzer, 12" | | Includes: | Dual beam system | Electron imaging | Focused ion beam milling | FOUP wafer handling | Omniprobe nanomanipulator | Scanning transmission electron microscopy (STEM) | Energy dispersive x-ray spectroscopy (EDX) | Gas injection systems (GIS) with tool automation: | Deposition: Platinum, Tungsten | Reactive: Insulator enhanced etching (XEF2) | TEM Sample preparation | Cross section and plan view lamellae | Low kV cleaning capability | SEM Imaging | Electron or ion beam milling/deposition | | Sample stage: 12" | Stage motion: 305 x 305 mm travel | Stage motion: 1.5 μm accuracy | Schottyky electron gun: 200 V - 30 kV | Image resolution: 7 nm FIB, 2 nm SEM | Liquid metal gallium ion source: 5 - 30 kV | Milling current range: pA - nA | STEM imaging: DF, BF, HAADF 1.1 nm at 30 kV.
  • FEI: 19011

    Details
    ID#:
    9024611
    Category:
    Spare Parts
    Standard sample test systems.
  • FEI: 200 XP

    Details
    ID#:
    168986
    Category:
    Ion Milling
    FIB system | Prelens ion column | Can be customized to your needs.
  • FEI: 4035-272-59592

    Details
    ID#:
    9024610
    Category:
    Spare Parts
    Wafer holder assy, 200/300.
  • FEI: 24115

    Details
    ID#:
    9024609
    Category:
    Spare Parts
    Quick change beam acceptance aperture replacement kits, 20nA.
  • FEI: 23229

    Details
    ID#:
    9024592
    Category:
    Spare Parts
    Aperture strip, prelens.
  • FEI: Nova Nanolab 200

    Details
    ID#:
    151369
    Category:
    Ion Milling
    Vintage:
    2005 
    Ion beam system, 2005 vintage.
  • PHILIPS / FEI: FIB-610

    Details
    ID#:
    9021863
    Category:
    Scanning Electron M...
    Focused ion beam imaging workstation | | Includes: | FEI LBO-51MA display | FEI PCSP system power controller | FEI ID2 deflection controller | FEI SCI stage controller | FEI 1IPS ion pump power supply | FEI 1GI gas injection controller | FEI CPS video controller | FEI MVD deposition control unit | TurboTronik NT-340-M turbo pump controller | | SCI stage control module is misaligned with the fastening holes | PCSP system power controller has missing joystick.
  • FEI: Morgagni

    Details
    ID#:
    9047343
    Category:
    Scanning Electron M...
    Vintage:
    2008 
    Scanning electron microscope (SEM) | Tungsten filament | 1 K x 1 K side mount camera | Single tilt holder | 100 kV | 2008 vintage.
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