FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker EDS | SDD X-ray system (2007 vintage) | 2006 vintage.
  • PHILIPS / FEI: Quanta

    Details
    ID#:
    9045193
    Category:
    Scanning Electron M...
    3D FIB | Tungsten electron column.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • PHILIPS / FEI: XL 40

    Details
    ID#:
    9049866
    Category:
    Scanning Electron M...
    SEM | LaB6 emitter, 6-position bias control | OS: Windows 3.11 | Fully integrated image storage | ET type Secondary Electron Detector | FEI (Philips) Solid State BSE detector | CCD Chamberscope | Resolution: 3nm at 30kV; 15nm at 1kV | Magnification range: 10x – 400,000x | Accelerating Voltage: 0.2 to 30kV | Drawer type door | 5 axis stage (XYZRT) – XYR motorized with 150mm travel in X and Y | Manual Tilt and Z adjustment | External Z adjustment of 37mm | Interior chamber size 379mm x 325mm x 315mm | (8) accessory ports, including BNC electrical feedthrough | Currently installed.
  • FEI: 4022-198-28181

    Details
    ID#:
    9024617
    Category:
    Spare Parts
    Vac. switch 15mbar REL.
  • FEI: 4022-268-00916

    Details
    ID#:
    9024616
    Category:
    Spare Parts
    Gauge, Pirani, APG-MP.
  • FEI: 4022-268-00561

    Details
    ID#:
    9024615
    Category:
    Spare Parts
    Micro-element measuring system.
  • FEI: 4022-262-21611

    Details
    ID#:
    9024618
    Category:
    Spare Parts
    Deflector test box.
  • FEI: 4035-272-16981

    Details
    ID#:
    9024619
    Category:
    Spare Parts
    F/G, S-ion column.
  • FEI: XL 30 FEG

    Details
    ID#:
    9028893
    Category:
    Scanning Electron M...
    TEM, 1996 vintage.
  • FEI: DualBeam 820

    Details
    ID#:
    9026430
    Category:
    Ion Milling
    Dual ion beam FIB / SEM.
  • FEI: Morgagni

    Details
    ID#:
    9047343
    Category:
    Scanning Electron M...
    Vintage:
    2008 
    Scanning electron microscope (SEM) | Tungsten filament | 1 K x 1 K side mount camera | Single tilt holder | 100 kV | 2008 vintage.
  • FEI: 5322-695-16115

    Details
    ID#:
    9024620
    Category:
    Spare Parts
    Poletip 60° Snorlens.
  • FEI: 5322-695-16148

    Details
    ID#:
    9024614
    Category:
    Spare Parts
    Detector, thru lens, TLD.
  • FEI: 4022-260-56891

    Details
    ID#:
    9024613
    Category:
    Spare Parts
    Aperture strip, FEG/SFEG.
  • FEI: 4035-272-05751

    Details
    ID#:
    9024607
    Category:
    Spare Parts
    CDEM.
  • FEI: 23229

    Details
    ID#:
    9024592
    Category:
    Spare Parts
    Aperture strip, prelens.
  • FEI: Tecnai F30

    Details
    ID#:
    9063939
    Category:
    Scanning Electron M...
    FE-TEM | | Includes: | TEM Body: Main unit | FEG Gun: Electron gun | H/T Tank | Chiller with PCW supply | Power cabinet: Main unit with power supply | STEM Cabinet: STEM Cabinet, (2) PC and HDD Remote | TEM Cabinet | Water rack | Cover | Desk | ETC: Monitor, turbo controller | | Non-SMIF | Automatic online component: No | Wafer OF Type: Notch at 6 o'clock | Software OS: Windows | No PPD | Option for lens cloudiness: PL Purge | 2007 vintage.
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