FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 200 MK2

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker AXS Quantax 400 SDD X-ray detector (2007 vintage) | Low Vacuum Mode | Environmental Mode | Integrated CCD chamberscope | PC-based Windows XP GUI for FE-SEM and EDS | Turbo pumped specimen chamber | Emitter: installed | 2006 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9072023
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    3D FIB-SEM | Electron column: Magnum with 20nA | ESEM mode | FIB column | 2004 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9095679
    Category:
    Scanning Electron M...
    3D Scanning electron microscopes (SEM). |
  • FEI: Nova NanoSEM 450

    Details
    ID#:
    9070198
    Category:
    Scanning Electron M...
    FE-SEM | Manual user interface | Support computer | Helix detector | Retractable STEM detector (STEMIII) | DBS detector retractable | GAD low-kV SSBSED | 6-Channel detector amplifier | Quick loader | STEM III quickloader adaption; pre-tilted holder | Plasma cleaner | CryCleaner EC | Nav-Cam | SIS Scandium imagine software | (4) SIS Scandium desktop license | SIS Scandium solution height | Network dongle licences 50 | Correlative navigation | 4" Wafer holder | 6" Wafer holder BON | UMB Specimen holder kit | Acoustic enclosure for prevacuum pump | 50-pin electrical feedthrough | 7-pin Coax electrical feedthrough | TEAM integration kit | (4) Thermoflex Chiller, 50Hz.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • FEI: Expida 1285

    Details
    ID#:
    9095881
    Category:
    Ion Milling
    Wafer Size:
    8"-12" 
    Scanning Microscope System, 8"-12" | Integrated electron and ion columns for semi-automated process control | Defect review, characterization, and failure analysis | | (1) Notched wafer holder | In-lens detection system for secondary and backscattered electrons | FEI xP software: wafer alignment, repetitive FIB operations, and critical dimension | (6) axial accessory ports for gas chemistry (4 maximum) | EDS detectors | Optical microscopes | Automatic vacuum system with integrated wafer loadlock | Oil-free turbomolecular pumping system for specimen chamber | (3) Ion pumps for differential pumping of ion and electron columns | Rough pump foreline | Robotic 8"/12" autoloader with non-contact prealigner | | High resolution Sirion FE-SEM column: 0.2 to 30 KeV | Schottky thermal field emitter | 60° Dual-objective lens: field free and immersion modes | Motorized heated objective apertures | | High intensity FEI Sidewinder ion column | Beam current range from 1 pA to 20 nA. | | (5) Axis motorized 305 mm stage | High accuracy optical encoders | Closed loop computer control | Multi-axis joystick | | Distributed control | Pentium-based host computer | Controls multiple single-board satellite processors | MS Windows operating system | Integrated 19" LCD color monitor | Video printer | | Manual user interface (MUIF) console | Stigmation | Magnification | XY fine position | Standard mouse control | | Integral vibration and stray field cancellation system | SEMI S2-0703 and CE compliant. | | Options available: | Roughing pump | FOUP, SMIF, or open cassette load.
  • FEI: DualBeam 865

    Details
    ID#:
    9076200
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2002 
    Dual ion beam FIB / SEM | Schottky FEG SEM | Magnum ion column | Low KV capable for Hi-Res TEM sample preparation | SE and BSE imaging | Secondary ion imaging | Resolution of SEM: 3 nm at 5 KV and 30 KV | Software: Window XP, FEI XP UI | Stage: 200 mm full travel, -5° to 60° tilt | (3) GISes | Wafer robot | | De-installed in Q4 2012 | 2002 vintage.
  • FEI: SDP-100 SIMS III

    Details
    ID#:
    9062899
    Category:
    Spare Parts
    SIMS detector | For FIB-200 dual beam FIB/SEM.
  • FEI: Tecnai F30 S-Twin

    Details
    ID#:
    9062878
    Category:
    Scanning Electron M...
    FE-TEM | 300KV | | Operational system: | Electron microscope TECNAI F30 S-TWIN, FP 5035/20 | NEC 20" Monitor, 9432-909-93371 | Extended Work Station, 5352/02 | Imaging and analysis software, 5400/00 | CompuStage Low Background Dbl-tilt holder, 6595/15 | Low dose exposure technique, 5407/00 | 28 sheet film holder, 6209/20 | Magazine for 56 unexposed sheet film holders, 6222/00 | Magazine for 56 exposed sheet film holders, 6223/00 | Desiccator for 2 magazines, 92021 | Replacement FEG assembly, 6180/00 | Mains matching Transformer, 6345/51 | Cooling water unit 60hz, 9432 909 96311 | Spare Objective Aperture, 6149/50 | FEG Diagnostics, 5265/00 | TEM General Diagnostics, 5266/00 | STEM General Diagnostics, 5267/00 | HT Diagnostics, 5269/20 | Air compressor, 9432-909-96271 | Electron optics: | Tecnai Scripting, 5451/00 | Tecnai Photo montage, 5456/00 | Gatan 894.P27FAP | | STEM and HAADF: | EDX Spectroscopy Technique, 5402/00 | Digital Pulse Processor, 9432-909-95322 | Detector Unit , PV 9761/08 | Beam Control and Mapping software Pkg, 9432-909-95391 | EDAX Mat.Sc. TEM SW, 95371 | External Analog Interface XAIB, 6778/00 | | GATAN Cameras: | Gatan Ultrascan 1000 2kx2k / Grade 2(B) | Gatan retractable TV rate CCD Camera type 692, 9432-909-22434 | Digital Micrograph for Tecnai, 5406/40 | Slow Scan CCD imaging technique, 5406/00 | TV rate imaging Technique, 5405/00 | | Holography Option 2D Dopant Profiling: | Lorenz Lens, 9432-900-22431 | Biprism Holder, 9432-900-22432 | Holoworks SW (Gatan), 9432-900-22433.
  • FEI: Vectra 986+

    Details
    ID#:
    9062560
    Category:
    Ion Milling
    Wafer Size:
    6" 
    Physical analysis tool, 6" | OBIC | Flood Gun | Tilt and Rotate Cassette | FIB Assist | Laser stage: interferometry | 50kV column | IET: no | Gases: XeF2, Cl2, TMCTS, H2O, WF6 | Currently crated and warehoused.
  • TRANE: CVHE 450

    Details
    ID#:
    9043070
    Category:
    Chillers - Industri...
    450 Tons Water Cooled Chiller | Voltage utilization range: 414 - 506 VAC | Maximum over-current protective device: 600 Amps | 460 V, 60 Hz, 3-Ph, 196 kW | Hours: ~47,000 | 2004 vintage.
  • FEI: Tecnai F30

    Details
    ID#:
    9063939
    Category:
    Scanning Electron M...
    FE-TEM | | Includes: | TEM Body: Main unit | FEG Gun: Electron gun | H/T Tank | Chiller with PCW supply | Power cabinet: Main unit with power supply | STEM Cabinet: STEM Cabinet, (2) PC and HDD Remote | TEM Cabinet | Water rack | Cover | Desk | ETC: Monitor, turbo controller | | Non-SMIF | Automatic online component: No | Wafer OF Type: Notch at 6 o'clock | Software OS: Windows | No PPD | Option for lens cloudiness: PL Purge | 2007 vintage.
  • FEI: 23229

    Details
    ID#:
    9024592
    Category:
    Spare Parts
    Aperture strip, prelens.
  • FEI: Tecnai G2 F20

    Details
    ID#:
    141774
    Category:
    Scanning Electron M...
    TEM | S-Twin lens | EDAX EDS included | 2004 vintage.
  • PHILIPS / FEI: XL 40

    Details
    ID#:
    9065023
    Category:
    Scanning Electron M...
    FEG SystemWindows NT | EDAX (DX-4) system | Magnification range: 10x to 400,000x | ET type Secondary Electron Detector | FEI (Philips) Solid State BSD detector | MCtrl version 6.0 | Fully integrated image storage | CCD Chamber scope | 35 degree X-Ray takeoff angle | 3nm at 30kV; 15nm at 1kV | Accelerating Voltage: 0.2 to 30kV | | Stage & Specimen Handling: | Drawer type door | 5 axis stage (XYZRT) ­ XYR motorized | 150mm motorized travel in X and Y | Manual Tilt and Z | External Z adjust of 37mm | Maximum free space of 55mm for thick specimens | Interior chamber size 379mm x 325mmx 315mm | | Neslab chiller and pump included | 1996 vintage.
  • PHILIPS / FEI: FIB-610

    Details
    ID#:
    9021863
    Category:
    Scanning Electron M...
    Focused ion beam imaging workstation | | Includes: | FEI LBO-51MA display | FEI PCSP system power controller | FEI ID2 deflection controller | FEI SCI stage controller | FEI 1IPS ion pump power supply | FEI 1GI gas injection controller | FEI CPS video controller | FEI MVD deposition control unit | TurboTronik NT-340-M turbo pump controller | | SCI stage control module is misaligned with the fastening holes | PCSP system power controller has missing joystick.
  • FEI: 800

    Details
    ID#:
    9046863
    Category:
    Ion Milling
    Focused ion beam system | 8" XY Stage travel | Prelens | (2) GIS | 1999 vintage.
  • FEI: Tecnai 10

    Details
    ID#:
    151424
    Category:
    Scanning Electron M...
    TEM, 100kV | Biological Set up | Optional AMT Sidemount CCD.
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