FEI QUANTA 450 Products

  • FEI: Nova NanoSEM 450

    Details
    ID#:
    9070198
    Category:
    Scanning Electron M...
    FE-SEM | Manual user interface | Support computer | Helix detector | Retractable STEM detector (STEMIII) | DBS detector retractable | GAD low-kV SSBSED | 6-Channel detector amplifier | Quick loader | STEM III quickloader adaption; pre-tilted holder | Plasma cleaner | CryCleaner EC | Nav-Cam | SIS Scandium imagine software | (4) SIS Scandium desktop license | SIS Scandium solution height | Network dongle licences 50 | Correlative navigation | 4" Wafer holder | 6" Wafer holder BON | UMB Specimen holder kit | Acoustic enclosure for prevacuum pump | 50-pin electrical feedthrough | 7-pin Coax electrical feedthrough | TEAM integration kit | (4) Thermoflex Chiller, 50Hz.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker EDS | SDD X-ray system (2007 vintage) | 2006 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta

    Details
    ID#:
    9045193
    Category:
    Scanning Electron M...
    3D FIB | Tungsten electron column.
  • FEI: Vectra 986+

    Details
    ID#:
    9062560
    Category:
    Ion Milling
    Wafer Size:
    6" 
    Physical analysis tool, 6" | OBIC | Flood Gun | Tilt and Rotate Cassette | FIB Assist | Laser stage: interferometry | 50kV column | IET: no | Gases: XeF2, Cl2, TMCTS, H2O, WF6 | Currently crated and warehoused.
  • FEI: 820

    Details
    ID#:
    9052452
    Category:
    Ion Milling
    Focused ion beam dual beam system | 220 V, 50/60 Hz, 3,500 VA | 1996 vintage.
  • FEI: 820

    Details
    ID#:
    67528
    Category:
    Ion Milling
    Focused Ion Beam dual beam system, complete with extra accessories.
  • FEI: Morgagni

    Details
    ID#:
    9051785
    Category:
    Scanning Electron M...
    TEM | Currently installed.
  • FEI: DA300

    Details
    ID#:
    9052303
    Category:
    Wafer Testing And M...
    Wafer Size:
    12" 
    Defect analyzer, 12" | | Includes: | Dual beam system | Electron imaging | Focused ion beam milling | FOUP wafer handling | Omniprobe nanomanipulator | Scanning transmission electron microscopy (STEM) | Energy dispersive x-ray spectroscopy (EDX) | Gas injection systems (GIS) with tool automation: | Deposition: Platinum, Tungsten | Reactive: Insulator enhanced etching (XEF2) | TEM Sample preparation | Cross section and plan view lamellae | Low kV cleaning capability | SEM Imaging | Electron or ion beam milling/deposition | | Sample stage: 12" | Stage motion: 305 x 305 mm travel | Stage motion: 1.5 μm accuracy | Schottyky electron gun: 200 V - 30 kV | Image resolution: 7 nm FIB, 2 nm SEM | Liquid metal gallium ion source: 5 - 30 kV | Milling current range: pA - nA | STEM imaging: DF, BF, HAADF 1.1 nm at 30 kV.
  • FEI: 825i

    Details
    ID#:
    194572
    Category:
    Ion Milling
    Ion beam inspection tool, 8" | EDX is not working | Currently de-installed | Cables intact | 1998 vintage.
  • FEI: Nova Nanolab 200

    Details
    ID#:
    151369
    Category:
    Ion Milling
    Vintage:
    2005 
    Ion beam system, 2005 vintage.
  • PHILIPS / FEI: XL 40

    Details
    ID#:
    9065023
    Category:
    Scanning Electron M...
    FEG SystemWindows NT | EDAX (DX-4) system | Magnification range: 10x to 400,000x | ET type Secondary Electron Detector | FEI (Philips) Solid State BSD detector | MCtrl version 6.0 | Fully integrated image storage | CCD Chamber scope | 35 degree X-Ray takeoff angle | 3nm at 30kV; 15nm at 1kV | Accelerating Voltage: 0.2 to 30kV | | Stage & Specimen Handling: | Drawer type door | 5 axis stage (XYZRT) ­ XYR motorized | 150mm motorized travel in X and Y | Manual Tilt and Z | External Z adjust of 37mm | Maximum free space of 55mm for thick specimens | Interior chamber size 379mm x 325mmx 315mm | | Neslab chiller and pump included | 1996 vintage.
  • FEI: DualBeam 820

    Details
    ID#:
    9026430
    Category:
    Ion Milling
    Dual ion beam FIB / SEM.
  • FUJI IMPULSE: FA-450-5W

    Details
    ID#:
    9050694
    Category:
    Packaging
    Electric sealer | Seal width: 5 mm | Seal length: 450 mm.
  • FEI: 4022-198-28181

    Details
    ID#:
    9024617
    Category:
    Spare Parts
    Vac. switch 15mbar REL.
  • LEYBOLD HERAEUS: TMP 450

    Details
    ID#:
    180233
    Category:
    Pumps
    Turbo pumps with Turbotronik NT 450 controllers.
  • TRANE: CVHE 450

    Details
    ID#:
    9043070
    Category:
    Chillers - Industri...
    450 Tons Water Cooled Chiller | Voltage utilization range: 414 - 506 VAC | Maximum over-current protective device: 600 Amps | 460 V, 60 Hz, 3-Ph, 196 kW | Hours: ~47,000 | 2004 vintage.
  • FEI: Tecnai F30

    Details
    ID#:
    9063939
    Category:
    Scanning Electron M...
    FE-TEM | | Includes: | TEM Body: Main unit | FEG Gun: Electron gun | H/T Tank | Chiller with PCW supply | Power cabinet: Main unit with power supply | STEM Cabinet: STEM Cabinet, (2) PC and HDD Remote | TEM Cabinet | Water rack | Cover | Desk | ETC: Monitor, turbo controller | | Non-SMIF | Automatic online component: No | Wafer OF Type: Notch at 6 o'clock | Software OS: Windows | No PPD | Option for lens cloudiness: PL Purge | 2007 vintage.
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