FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9095679
    Category:
    Scanning Electron M...
    3D Scanning electron microscopes (SEM). |
  • PHILIPS / FEI: Quanta 400

    Details
    ID#:
    9100096
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX | Software included.
  • PHILIPS / FEI: Quanta 200 MK2

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker AXS Quantax 400 SDD X-ray detector (2007 vintage) | Low Vacuum Mode | Environmental Mode | Integrated CCD chamberscope | PC-based Windows XP GUI for FE-SEM and EDS | Turbo pumped specimen chamber | Emitter: installed | 2006 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9072023
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    3D FIB-SEM | Electron column: Magnum with 20nA | ESEM mode | FIB column | 2004 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • FEI: DualBeam 865

    Details
    ID#:
    9076200
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2002 
    Dual ion beam FIB / SEM | Schottky FEG SEM | Magnum ion column | Low KV capable for Hi-Res TEM sample preparation | SE and BSE imaging | Secondary ion imaging | Resolution of SEM: 3 nm at 5 KV and 30 KV | Software: Window XP, FEI XP UI | Stage: 200 mm full travel, -5° to 60° tilt | (3) GISes | Wafer robot | | De-installed in Q4 2012 | 2002 vintage.
  • FEI: Expida 1285

    Details
    ID#:
    9095881
    Category:
    Ion Milling
    Wafer Size:
    8"-12" 
    Scanning Microscope System, 8"-12" | Integrated electron and ion columns for semi-automated process control | Defect review, characterization, and failure analysis | | (1) Notched wafer holder | In-lens detection system for secondary and backscattered electrons | FEI xP software: wafer alignment, repetitive FIB operations, and critical dimension | (6) axial accessory ports for gas chemistry (4 maximum) | EDS detectors | Optical microscopes | Automatic vacuum system with integrated wafer loadlock | Oil-free turbomolecular pumping system for specimen chamber | (3) Ion pumps for differential pumping of ion and electron columns | Rough pump foreline | Robotic 8"/12" autoloader with non-contact prealigner | | High resolution Sirion FE-SEM column: 0.2 to 30 KeV | Schottky thermal field emitter | 60° Dual-objective lens: field free and immersion modes | Motorized heated objective apertures | | High intensity FEI Sidewinder ion column | Beam current range from 1 pA to 20 nA. | | (5) Axis motorized 305 mm stage | High accuracy optical encoders | Closed loop computer control | Multi-axis joystick | | Distributed control | Pentium-based host computer | Controls multiple single-board satellite processors | MS Windows operating system | Integrated 19" LCD color monitor | Video printer | | Manual user interface (MUIF) console | Stigmation | Magnification | XY fine position | Standard mouse control | | Integral vibration and stray field cancellation system | SEMI S2-0703 and CE compliant. | | Options available: | Roughing pump | FOUP, SMIF, or open cassette load.
  • LEYBOLD HERAEUS: TMP 450

    Details
    ID#:
    180233
    Category:
    Pumps
    Turbo pumps with Turbotronik NT 450 controllers.
  • FEI: 4022-198-28181

    Details
    ID#:
    9024617
    Category:
    Spare Parts
    Vac. switch 15mbar REL.
  • FEI: Tecnai 20

    Details
    ID#:
    9096276
    Category:
    Scanning Electron M...
    Transmission Electron Microscope (TEM).
  • FEI: Vectra 986+

    Details
    ID#:
    9062560
    Category:
    Ion Milling
    Wafer Size:
    6" 
    Physical analysis tool, 6" | OBIC | Flood Gun | Tilt and Rotate Cassette | FIB Assist | Laser stage: interferometry | 50kV column | IET: no | Gases: XeF2, Cl2, TMCTS, H2O, WF6 | Currently crated and warehoused.
  • FEI: Tecnai 10

    Details
    ID#:
    151424
    Category:
    Scanning Electron M...
    TEM, 100kV | Biological Set up | Optional AMT Sidemount CCD.
  • FUJI IMPULSE: FA-450-5W

    Details
    ID#:
    9050694
    Category:
    Packaging
    Electric sealer | Seal width: 5 mm | Seal length: 450 mm.
  • FEI: DB235

    Details
    ID#:
    9095265
    Category:
    Ion Milling
    Vintage:
    2001 
    DualBeam FIB System | 5 to 30 kV in a current range of 1pA to 20 nA | Magnum column | 2001 vintage.
  • FEI: 820

    Details
    ID#:
    9082626
    Category:
    Spare Parts
    FIB Mainframe only.
  • FEI: Strata DB 235

    Details
    ID#:
    9095914
    Category:
    Scanning Electron M...
    Dual beam field emission scanning electron microscope (FE-SEM) | Auto FIB Software | Auto TEM Wizard Software | Solid state STEM detector and pre-amplifier | | Gas injection system | Platinum deposition | Enhanced etch | Selective carbon mill | Thermal printer | Computer | Electronic bench.
  • FEI: Tecnai F30 U-Twin

    Details
    ID#:
    9095917
    Category:
    Scanning Electron M...
    Transmission electron microscope (TEM) | | Desk with the electron optical column | Operational controls | Vacuum system | Cabinet with power supplies | HT generator | Windows NT and microscope control software | | Electronic camera systems | Below-the-chamber MultiScan | TV cameras on-axis or off-axis | | Microscope Column | Field emission gun | Schottky field emitter | Isolated vacuum system for the gun | (2) Condenser lenses | S-TWIN objective lens with motorized 5-axis eucentric goniometer: up to ± 40º tilt | Diffraction lens | Intermediate lens | (2) Projector lenses | Housing for TV cameras | | | Projection chamber | (1) Viewing window | 135 mm diameter viewing screen | Small screen for critical focusing | 12X Binocular Viewer: 4.5 mm exit pupil, 16 mm field of view | Beam stop mechanism | | Vacuum System | Vacuum system incorporated in the main desk | Vacuum in the projection chamber is separated by a 200 µm differential pumping aperture | | Cooling device | Cold trap | Liquid nitrogen Dewar is fitted in the goniometer | | Rotary pump with buffer vessel | Oil diffusion pump | Turbomolecular pump | (4) Ion getter pumps | Automatic vacuum valve between the gun and the column | | Control Panels | (1) Common graphical user interface operating under Windows NT. | User-defined logical combinations of controls are grouped on (2) movable control panels | | Operating and service instructions | Tools | Vacuum test pieces | Spare indium seals | Transformer oil | Santovac oil. | (1) Cut-film exchange unit | (2) Exposed-film magazines | Cooling device | Selected area apertures: 10 µm, 40 µm, 200 µm, 800 µm | C1 condenser apertures: 30 µm, 50 µm, 70 µm, 2000 µm | C2 condenser apertures: 30 µm, 50 µm, 100 µm, 150 µm | Objective apertures: 20 µm Au, 60 µm Au, 100 µm Au, 750 µm Pt | | Requirements: | Cooling water supply with low-temperature fluctuation | Compressed air to operate pneumatic valves | Supplies of liquid nitrogen for cold trap | | Options available: | Workstation and monitor | Cut film holders: FP 6208/20 or FP 6209/20 | Double-tilt analytical holder: FP 6595/55 | Additional set of 20 spacer rings 100 µm thick: FP 6171/10 | Additional set of 20 spacer rings 200 µm thick: FP 6171/20 | Additional set of 20 clamping rings: FP 6172/00 | | Voltages up to 300 kV | 220 V, 50/60 Hz.
  • FEI: Expida 1265

    Details
    ID#:
    9096201
    Category:
    Ion Milling
    Dual beam FIB / SEM system | De-installed Q1 2015.
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