FEI QUANTA 450 Products

  • FEI: Quanta 200

    Details
    ID#:
    9052447
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    3D Dual beam Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) | | Hardware: | Standard Detectors: (ETD, CCD camera) | Additional Environmental Detectors: GSED, X-ray PLA | 2-channel Detector Pre-amplifier | Stage: 50mm 5-axis motorized | External Scan Interface | (1) Platinum Gas Insertion System (GIS) | Turbo Molecular Pump with Roughing Pumps (2x Edwards XDS10) | Compressor (120V, 60Hz with 4-liter tank) | Power: 230VAC 50/60Hz, 20A max current requirement | | Hardware Upgrade: | Nanopattern Generation System (NPGS) | | Performance (at install): | Electron Column: 2.86nm resolution at 30kV | Ion Column: 8.245nm resolution at 30kV | | Consumables: | Spare tungsten filaments | Spare apertures | | PC (FIB): | HP xw4400 workstation, Intel Core2 6300, 1.86Ghz | Windows XP, xTm software version 1.7.4 | | PC (NPGS): | HP xw4600 workstation, Intel Core2Duo E8200 2.66 Ghz | Windows XP, NPGS Version 9.0.265 (2012) | | Additional Software: | AutoFIB | AutoTEM | AutoSlice and View | Amira | | 2006 vintage.
  • PHILIPS / FEI: Quanta

    Details
    ID#:
    9045193
    Category:
    Scanning Electron M...
    3D FIB | Tungsten electron column.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker EDS | SDD X-ray system (2007 vintage) | 2006 vintage.
  • FEI: 300 HP

    Details
    ID#:
    189618
    Category:
    Scanning Electron M...
    Dual beam FIB-SEM, 12" | | DA 300HP (Dual-Beam FEI for Biopsy JDA) | Nanolift | Express FOUP-Loader (25), 300mm, incl. 200mm option | AutoFIB | AutoTEM | Th. Printer | Chiller | UI cart | | 2008 vintage.
  • FEI: Certus 3D

    Details
    ID#:
    200445
    Category:
    Ion Milling
    Vintage:
    2007 
    FIB 3D dual beam system, P1 level tool | | Includes: | (2) Loadports: | Loadport, 100 x 1.2 mm | 2nd Loadport, 100 x 1.2 mm | | Detectors: CDEM, TLD | Mounted flange | Custom wafer holder for 4" Germanium wafers, NSR required | Additional material types: Tungsten, Carbon Dep, and enhanced Etch | | High resolution FE-SEM column: | 0.2 to 2 KeV | Schottky thermal field emitter | 45 degree objective lens | Motorized heated objective apertures | High intensity FEI Sidewinder ion column | Beam current range: 1 pA to 20 nA | | In-lens detection system | FEI exclusive IC3D software | (6) Axial accessory ports | Automatic vacuum system with integrated wafer loadlock | Oil-free turbomolecular pumping system for specimen chamber | (3) Ion pumps | Robotic cassette-to-cassette autoloader | Non-contact pre-aligner and dual cassette stations | (4) Axis motorized 12" stage with optical encoders and closed loop computer control | Multi-axis joystick | (1) Wafer holder (for standard substrates) | Video Printer | Team Systems Model TP-6530: High-resolution thermal printer | Optical microscope: | Magnification range from 10X to 40X | MS-Windows operating system | 21-inch color flat screen monitor | Integral vibration and stray field cancellation system | Prevacuum pump: Edwards L70 pre-vacuum pump. | Chiller: Neslab HX-75 chiller | Slight Z adjustment | Source: Tungsten | CE-marked | | Optional: | I-Watch Software v1.3 | IC3D Workstation, with IC3D v 6.0 | GIS Insulator Enhanced Etch (XeF2, IEE) | | Needs to be replaced: | PRA700 Power supply PN 4022-268-01378 | SEM Encoder | Electron flange | | De-installed | 2007 vintage.
  • PHILIPS / FEI: XL 40

    Details
    ID#:
    9049866
    Category:
    Scanning Electron M...
    SEM | LaB6 emitter, 6-position bias control | OS: Windows 3.11 | Fully integrated image storage | ET type Secondary Electron Detector | FEI (Philips) Solid State BSE detector | CCD Chamberscope | Resolution: 3nm at 30kV; 15nm at 1kV | Magnification range: 10x – 400,000x | Accelerating Voltage: 0.2 to 30kV | Drawer type door | 5 axis stage (XYZRT) – XYR motorized with 150mm travel in X and Y | Manual Tilt and Z adjustment | External Z adjustment of 37mm | Interior chamber size 379mm x 325mm x 315mm | (8) accessory ports, including BNC electrical feedthrough | Currently installed.
  • FEI: 4022-260-56891

    Details
    ID#:
    9024613
    Category:
    Spare Parts
    Aperture strip, FEG/SFEG.
  • FEI: Nova NanoSEM 430

    Details
    ID#:
    9047188
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    SEM | High and low vacuum | High resolution | FEG SEM | 4" mm x 4" mm stage | Loaded: TLD SE, BSE, SED, LV SED (LVD), UHR LV SED (Helix), Low KV BSED, GAD | 2011 vintage.
  • FEI: DualBeam 835

    Details
    ID#:
    9047185
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam FIB / SEM, 8" | Magnum ion | 2 GIS | 8" Load lock | 2000 vintage.
  • FEI: DualBeam 235

    Details
    ID#:
    9047177
    Category:
    Ion Milling
    Vintage:
    2003 
    Dual ion beam FIB / SEM | Magnum ion column | 2 GIS | Small chamber dual beam | | Omniprobe, evactron, and more GIS available | 2003 vintage.
  • FEI: DualBeam 835

    Details
    ID#:
    9047178
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam SEM / FIB, 8" | Magnum ion | 2 GIS | Wafer loading robot | 2000 vintage.
  • FEI: DualBeam Expida 1285

    Details
    ID#:
    9047183
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2000 
    Dual ion beam FIB / SEM, 8" - 12" | 2000 vintage.
  • FEI: DualBeam 830

    Details
    ID#:
    9047184
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    1999 
    Dual ion beam FIB / SEM, 8" | Pre lens ion | 2 GIS | Turbo vacuum | 1999 vintage.
  • FEI: 19011

    Details
    ID#:
    9024611
    Category:
    Spare Parts
    Standard sample test systems.
  • FEI: 4035-272-59592

    Details
    ID#:
    9024610
    Category:
    Spare Parts
    Wafer holder assy, 200/300.
  • FEI: Morgagni

    Details
    ID#:
    9051785
    Category:
    Scanning Electron M...
    TEM | Currently installed.
  • FEI: Tecnai 12 Spirit

    Details
    ID#:
    118438
    Category:
    Scanning Electron M...
    TEM, 120kV | Includes Lab6, Bio Twin | 4000 AMT side mount CCD | 2006 vintage.
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