FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • FEI: Nova NanoSEM 450

    Details
    ID#:
    9070198
    Category:
    Scanning Electron M...
    FE-SEM | Manual user interface | Support computer | Helix detector | Retractable STEM detector (STEMIII) | DBS detector retractable | GAD low-kV SSBSED | 6-Channel detector amplifier | Quick loader | STEM III quickloader adaption; pre-tilted holder | Plasma cleaner | CryCleaner EC | Nav-Cam | SIS Scandium imagine software | (4) SIS Scandium desktop license | SIS Scandium solution height | Network dongle licences 50 | Correlative navigation | 4" Wafer holder | 6" Wafer holder BON | UMB Specimen holder kit | Acoustic enclosure for prevacuum pump | 50-pin electrical feedthrough | 7-pin Coax electrical feedthrough | TEAM integration kit | (4) Thermoflex Chiller, 50Hz.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9072023
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    3D FIB-SEM | Electron column | ESEM mode | FIB column | 2004 vintage.
  • PHILIPS / FEI: Quanta 200 MK2

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker AXS Quantax 400 SDD X-ray detector (2007 vintage) | Low Vacuum Mode | Environmental Mode | Integrated CCD chamberscope | PC-based Windows XP GUI for FE-SEM and EDS | Turbo pumped specimen chamber | Emitter: installed | 2006 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • FEI: FIB200

    Details
    ID#:
    9082663
    Category:
    Ion Milling
    Focused Ion Beam System | | Single beam | Pre-lens ion column provides image resolution of 7nm and milling current up to 11nA | 50x50mm XY stage, with rotation, tilt and z-motions | Loadlock with separate pump for fast sample exchange | Turbo pump for main chamber | Real time monitor to observe milling, aka Leader oscilloscope | Keithley Pico-ammeter to measure beam current | Chamber camera and monitor | Computer control with FEI software and Seiko screen printer | Manual user interface (MUI), joystick and mouse controls | Manuals | (2) gas injectors with controller: choose from iodine, XeF2, Platinum, or TEOS gases | Line transformer (main), AC distribution box and Maintenance tool kit.
  • FEI: DualBeam 865

    Details
    ID#:
    9076200
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2002 
    Dual ion beam FIB / SEM | Schottky FEG SEM | Magnum ion column | Low KV capable for Hi-Res TEM sample preparation | SE and BSE imaging | Secondary ion imaging | Resolution of SEM: 3 nm at 5 KV and 30 KV | Software: Window XP, FEI XP UI | Stage: 200 mm full travel, -5° to 60° tilt | (3) GISes | Wafer robot | | De-installed in Q4 2012 | 2002 vintage.
  • FEI: Tecnai 10

    Details
    ID#:
    151424
    Category:
    Scanning Electron M...
    TEM, 100kV | Biological Set up | Optional AMT Sidemount CCD.
  • FEI: 4035-272-59592

    Details
    ID#:
    9024610
    Category:
    Spare Parts
    Wafer holder assy, 200/300.
  • FEI: Morgagni

    Details
    ID#:
    9047343
    Category:
    Scanning Electron M...
    Vintage:
    2008 
    Scanning electron microscope (SEM) | Tungsten filament | 1 K x 1 K side mount camera | Single tilt holder | 100 kV | 2008 vintage.
  • FEI: Tecnai F30

    Details
    ID#:
    9030550
    Category:
    Scanning Electron M...
    S/TEM | 300 kV Schottky FEG | BF, DF, HAADF | EFTEM EELS | EDS | 2k x 2k CCD | Gatan 863 Tridiem | BiPrism | Lorentz lens | Tecnai free lens control | Single tilt, high visibility double tilt, and holography holders.
  • FEI: DB235

    Details
    ID#:
    9047177
    Category:
    Ion Milling
    Vintage:
    2003 
    Dual ion beam FIB / SEM | Magnum ion column | 2 GIS | Small chamber dual beam | | Omniprobe, evactron, and more GIS available | 2003 vintage.
  • FEI: 820

    Details
    ID#:
    9052452
    Category:
    Ion Milling
    Focused ion beam dual beam system | 220 V, 50/60 Hz, 3,500 VA | 1996 vintage.
  • FEI: Nova NanoLab 600

    Details
    ID#:
    9081351
    Category:
    Scanning Electron M...
    SEM | Ion gun: non-operational.
  • FEI: 5322-695-16115

    Details
    ID#:
    9024620
    Category:
    Spare Parts
    Poletip 60° Snorlens.
  • TRANE: CVHE 450

    Details
    ID#:
    9043070
    Category:
    Chillers - Industri...
    450 Tons Water Cooled Chiller | Voltage utilization range: 414 - 506 VAC | Maximum over-current protective device: 600 Amps | 460 V, 60 Hz, 3-Ph, 196 kW | Hours: ~47,000 | 2004 vintage.
  • FEI: DualBeam 820

    Details
    ID#:
    9026430
    Category:
    Ion Milling
    Dual ion beam FIB / SEM.
  • FEI: FB2000A

    Details
    ID#:
    9081933
    Category:
    Ion Milling
    Focused ion beam system.
  • FEI: 4022-197-94963

    Details
    ID#:
    9024608
    Category:
    Spare Parts
    PM supply 10kV EXS.
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