FEI QUANTA 450 Products

  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    151370
    Category:
    Scanning Electron M...
    Vintage:
    2005 
    ESEM with EDAX, 4nm | W SEM | Variable pressure | 50mm stage | EDAX Genesis EDS | Turbo vacuum | 2005 vintage.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9048292
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    FE-SEM | Bruker EDS | SDD X-ray system (2007 vintage) | 2006 vintage.
  • PHILIPS / FEI: Quanta 600

    Details
    ID#:
    9047315
    Category:
    Scanning Electron M...
    Vintage:
    2004 
    Environmental Scanning Electron Microscope, ESEM | SE / BSE | 6" Stage | 5-Axis motorized | TMP Vacuum | 2004 vintage.
  • PHILIPS / FEI: Quanta 250

    Details
    ID#:
    9047314
    Category:
    Scanning Electron M...
    Vintage:
    2011 
    Scanning electron microscope, (SEM) | Schottky FEG | Variable vacuum | 50 mm x 50 mm stage | SDD EDS package | 2011 vintage.
  • FEI: Nova NanoSEM 450

    Details
    ID#:
    9070198
    Category:
    Scanning Electron M...
    FE-SEM | Manual user interface | Support computer | Helix detector | Retractable STEM detector (STEMIII) | DBS detector retractable | GAD low-kV SSBSED | 6-Channel detector amplifier | Quick loader | STEM III quickloader adaption; pre-tilted holder | Plasma cleaner | CryCleaner EC | Nav-Cam | SIS Scandium imagine software | (4) SIS Scandium desktop license | SIS Scandium solution height | Network dongle licences 50 | Correlative navigation | 4" Wafer holder | 6" Wafer holder BON | UMB Specimen holder kit | Acoustic enclosure for prevacuum pump | 50-pin electrical feedthrough | 7-pin Coax electrical feedthrough | TEAM integration kit | (4) Thermoflex Chiller, 50Hz.
  • PHILIPS / FEI: Quanta 200

    Details
    ID#:
    9072023
    Category:
    Scanning Electron M...
    3D FIB-SEM | Includes: | Electron column | ESEM mode.
  • PHILIPS / FEI: Quanta

    Details
    ID#:
    9045193
    Category:
    Scanning Electron M...
    3D FIB | Tungsten electron column.
  • FEI: DualBeam 865

    Details
    ID#:
    9076200
    Category:
    Ion Milling
    Wafer Size:
    8" 
    Vintage:
    2002 
    Dual ion beam FIB / SEM | Schottky FEG SEM | Magnum ion column | Low KV capable for Hi-Res TEM sample preparation | SE and BSE imaging | Secondary ion imaging | Resolution of SEM: 3 nm at 5 KV and 30 KV | Software: Window XP, FEI XP UI | Stage: 200 mm full travel, -5° to 60° tilt | (3) GISes | Wafer robot | | De-installed in Q4 2012 | 2002 vintage.
  • FEI: 200 XP

    Details
    ID#:
    168986
    Category:
    Ion Milling
    FIB system | Prelens ion column | Can be customized to your needs.
  • FEI: 5322-695-16148

    Details
    ID#:
    9024614
    Category:
    Spare Parts
    Detector, thru lens, TLD.
  • TRANE: CVHE 450

    Details
    ID#:
    9043070
    Category:
    Chillers - Industri...
    450 Tons Water Cooled Chiller | Voltage utilization range: 414 - 506 VAC | Maximum over-current protective device: 600 Amps | 460 V, 60 Hz, 3-Ph, 196 kW | Hours: ~47,000 | 2004 vintage.
  • FEI: 800

    Details
    ID#:
    9046863
    Category:
    Ion Milling
    Focused ion beam system | 8" XY Stage travel | Prelens | (2) GIS | 1999 vintage.
  • FEI: 4022-268-00561

    Details
    ID#:
    9024615
    Category:
    Spare Parts
    Micro-element measuring system.
  • FEI: 800xP

    Details
    ID#:
    147705
    Category:
    Ion Milling
    Focused ion beam system | Pre lens column | 8" STG | 2 GIS | Turbo vacuum | 1998 vintage.
  • FEI: Morgagni

    Details
    ID#:
    9051785
    Category:
    Scanning Electron M...
    TEM | Currently installed.
  • FEI: Nova 200

    Details
    ID#:
    9046379
    Category:
    Scanning Electron M...
    Dual beam system, parts machine.
  • FEI: 200xP

    Details
    ID#:
    9046854
    Category:
    Ion Milling
    Focused ion beam system | Magnum ion column | 50 mm Stage | (2) GIC | Turbo vacuum | 1999 vintage.
  • FEI: 19011

    Details
    ID#:
    9024611
    Category:
    Spare Parts
    Standard sample test systems.
  • FEI: 835

    Details
    ID#:
    9058950
    Category:
    Ion Milling
    Ion beam FIB / SEM.
  • FEI: 820

    Details
    ID#:
    67528
    Category:
    Ion Milling
    Focused Ion Beam dual beam system, complete with extra accessories.
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